Characterisation of a ΔE–E particle telescope using the ANSTO heavy ion microprobe

Semiconductor planar processing technology has spurned the development of novel radiation detectors with applications in space, high energy physics, medical diagnostics, radiation protection and cancer therapy. The ANSTO heavy ion microprobe, which allows a wide range of ions to be focused into spot sizes of a few micrometers in diameter, has proven to be an essential tool for characterising these detectors using the Ion Beam Induced Charge (IBIC) imaging technique. The use of different ions and the wide range of available energies on the heavy ion microprobe, allows the testing of these devices with ionising particles associated with different values of linear energy transfer (LET).Quadruple coincidence measurements have been used to map the charge collection characteristics of a monolithic ΔE–E telescope. This was done through simultaneous measurement of the spatial coordinates of the microbeam relative to the sample and the response of both detector elements. The resulting charge collection maps were used to better understand the functionality of the device as well as to ascertain ways in which future device designs could be modified to improve performance.