| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1687825 | Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms | 2007 | 4 Pages |
Abstract
A Cu(1 0 0) surface has been investigated by means of time-of-flight low-energy ion scattering using 4He+ ions. Polar and azimuth scans have been performed. The evaluation of the obtained spectra demonstrates the influence of background contributions to the overall yield. Selection of single scattering processes was achieved by background subtraction. This allows for high surface sensitivity even for neutral scattering spectra.
Related Topics
Physical Sciences and Engineering
Materials Science
Surfaces, Coatings and Films
Authors
D. Primetzhofer, S.N. Markin, R. Kolarova, M. Draxler, R. Beikler, E. Taglauer, P. Bauer,