| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1687839 | Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms | 2007 | 5 Pages |
Abstract
Measurements of the secondary electron yields from uranium dioxide under impact of Xeq+ (q = 10–25, 0.03 keV ⩽ EKin ⩽ 81 keV) ions are presented. A strong increase of the secondary electron yield is observed with increasing charge state of the projectile both at normal and oblique incidences. No variation of the electron yield with the projectile kinetic energy is observed at normal incidence. Therefore, the electron emission process in highly charged ion – uranium dioxide (UO2) interactions is dominated by potential electron emission.
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Authors
F. Haranger, Ph. Boduch, H. Lebius, L. Maunoury, H. Rothard, B. Ban-d’Etat,