Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1688060 | Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms | 2006 | 5 Pages |
Abstract
Elemental Cu nanocrystals were synthesized in thin film SiO2 by ion implantation and thermal annealing. The local atomic structure and nanocrystal size distribution were investigated by means of extended X-ray absorption fine structure (EXAFS) spectroscopy and small angle X-ray scattering (SAXS), respectively. We quantify the bondlength contraction and increased structural disorder in the nanocrystals as compared to a bulk Cu reference. Both are proportional to the inverse of the nanocrystal diameter, which in turn is proportional to the surface-area-to-volume ratio. In particular we show that a simple liquid-drop model can explain the bondlength contraction and estimate the surface tension of nanocrystalline Cu to be 3.8 ± 0.4 J/m2.
Related Topics
Physical Sciences and Engineering
Materials Science
Surfaces, Coatings and Films
Authors
B. Johannessen, P. Kluth, D.J. Cookson, G.J. Foran, M.C. Ridgway,