| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1688076 | Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms | 2006 | 5 Pages |
Abstract
In order to provide a structural basis for the modelling of the electronic and magnetic properties of the Fe/NiO(0 0 1) interface we have performed polarization dependent Fe K-edge X-ray absorption measurements. A multi-shell fit of the data is presented and discussed. We find that a 2 ML Fe film exhibits a complete tetragonal distortion of the unit cell and demonstrate the formation of a planar FeO layer with expanded Fe–O distances perpendicular to the growth plane. We discuss a model for the interface with the FeO layer at the oxide–metal interface. At 10 ML thickness the tetragonal strain of the Fe film is partially released.
Keywords
Related Topics
Physical Sciences and Engineering
Materials Science
Surfaces, Coatings and Films
Authors
S. Colonna, P. Luches, S. Valeri, F. Boscherini,