| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1688960 | Vacuum | 2010 | 5 Pages |
Abstract
Analysis of ion sources based on a time-of-flight signal function is applied to quantify their emission characteristics as the hidden partial currents of the ionized species constituting, the total measured current, the centre-of-mass velocity of individual charge states, their abundance and the ion temperature.
Keywords
Related Topics
Physical Sciences and Engineering
Materials Science
Surfaces, Coatings and Films
Authors
Josef Krása, Andriy Velyhan, Eduard Krouský, LeoÅ¡ Láska, Karel Rohlena, Karel Jungwirth, JiÅà Ullschmied, Antonella Lorusso, Luciano Velardi, Vincenzo Nassisi, Agata Czarnecka, Leszek RyÄ, Piotr Parys, Jerzy WoÅowski,