Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1689254 | Vacuum | 2008 | 5 Pages |
Abstract
We calculate stress in YBa2Cu3O7âx/MgO (YBCO/MgO) and YBa2Cu3O7âx/LaAlO3 (YBCO/LAO) by XRD of the sample, Ï1 = â1.2 GPa and Ï2 = â1.4 GPa, respectively, which shows that the stress in YBCO/LAO is stronger than that in YBCO/MgO. In addition, microwave response of the two pieces of thin films is also investigated by microstrip resonator technique. Surface resistance and penetration depth of the films are obtained by analyzing S21 resonant curves of the microstrip resonator, the penetration depth λ0 = 280 nm for YBCO/MgO and λ0 = 265 nm for YBCO/LAO, and surface resistance Rs = 0.376 mΩ for YBCO/MgO and Rs = 2.660 mΩ for YBCO/LAO at 78 K, 10 GHz. The results show stronger stress in YBCO/LAO which lead to a larger microwave surface resistance than YBCO/MgO's. Some rational explanations are also analyzed and discussed in the paper.
Related Topics
Physical Sciences and Engineering
Materials Science
Surfaces, Coatings and Films
Authors
Li-Bin Shi, Cui-Yan Xu, Guo-Hua Zhang,