Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1689290 | Vacuum | 2010 | 4 Pages |
Abstract
This study investigates the electrical and morphological properties of polystyrene layers in the nanometre thickness range for organic and polymer based electronic applications. The paper aims to providing conduction data and information on trapped charges present in the polystyrene layer, as well as investigating how polystyrene properties change under differing annealing conditions. The maximum dielectric strength was found to be 4.0 MV cm−1, while fixed trapped charge and mobile trapped charge average densities were calculated to be 9.9 × 1011 cm−2 and 2.6 × 1012 cm−2 respectively. Optimum electrical characteristics were obtained at an anneal temperature of 90 °C, which is just below the glass transition temperature for polystyrene.
Related Topics
Physical Sciences and Engineering
Materials Science
Surfaces, Coatings and Films
Authors
D. Prime, S. Paul,