Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1689343 | Vacuum | 2007 | 5 Pages |
Abstract
The experiments have shown that the hydrogenation of the p-type wafers leads to the appearance of PV signal similar to that for silicon photodiodes as a result of the n-type layer creation near the hydrogenated surface. A drawing field created in the p-type wafers in consequence of their hydrogenation decreases the effect of the carrier diffusion length reduction due to electron irradiation that makes the hydrogenated p-type wafers less sensitive to the radiation impact.
Related Topics
Physical Sciences and Engineering
Materials Science
Surfaces, Coatings and Films
Authors
O. Zinchuk, N. Drozdov, A. Mazanik, A. Fedotov, P. Å»ukowski, J. Partyka, P. WÄgierek, T. KoÅtunowicz,