Article ID Journal Published Year Pages File Type
1689343 Vacuum 2007 5 Pages PDF
Abstract
The experiments have shown that the hydrogenation of the p-type wafers leads to the appearance of PV signal similar to that for silicon photodiodes as a result of the n-type layer creation near the hydrogenated surface. A drawing field created in the p-type wafers in consequence of their hydrogenation decreases the effect of the carrier diffusion length reduction due to electron irradiation that makes the hydrogenated p-type wafers less sensitive to the radiation impact.
Related Topics
Physical Sciences and Engineering Materials Science Surfaces, Coatings and Films
Authors
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