| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1690376 | Vacuum | 2013 | 4 Pages |
Abstract
Structural change in polyethylene naphthalate (PEN) foil during MeV proton beam irradiation was investigated by ion beam induced luminescence (IBIL). An aluminum thin film (thickness: 20 nm) was sputter-deposited on the upper surface of 4 μm thick PEN foil to evaluate how Al coating effects structural change. IBIL analysis reveals that the Al coating clearly reduces damage induced by ion beam irradiation, probably due to the enhancement of electrical conductivity of the foil.
► Al coating reduces degradation of PEN foil irradiated with MeV proton. ► Ion beam induced luminescence reveals structural changes in PEN and Al/PEN. ► The degradation is suppressed by the enhancement of electrical conductivity.
Related Topics
Physical Sciences and Engineering
Materials Science
Surfaces, Coatings and Films
Authors
Masahiro Saito, Shinji Nagata, Fumitaka Nishiyama, Toshiyuki Isshiki, Katsumi Takahiro,