Article ID Journal Published Year Pages File Type
1690676 Vacuum 2006 7 Pages PDF
Abstract
A quadrupole ion trap has been modified to perform dynamic pressure measurements during pulsed introduction of gases. A continuous electron beam is directed through the ion trap where the gas is ionized via electron impact. Ion and electron currents are monitored on the ring and end-cap electrodes, respectively. Dynamic pressure measurements in a region not accessible to a standard gauge are performed using a static quadrupole field. Characteristic current-voltage curves of the ion-trap gauge are presented and optimum operating conditions of the electron-ion optical system are identified in steady state conditions. The sensitivity of the ion-trap gauge is calibrated at these optimum conditions. In the pulsed gas mode ion and electron signals are measured simultaneously on a fast oscilloscope. The time constant of the circuit for the dynamic measurements is ∼129 μs and pressure variations of ∼10−4-1 Pa occur within 60-130 ms. The exponential decay of the ion signals is used to calculate pumping speeds for helium and argon gases. The distinctive advantages of pulsed gas injections over the use of static pressures in quadrupole ion-trap mass spectrometry are emphasized.
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Physical Sciences and Engineering Materials Science Surfaces, Coatings and Films
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