| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1690705 | Vacuum | 2012 | 5 Pages |
Abstract
⺠The atomistic model of film growth can produce realistic results. ⺠The molecular-dynamics part of the atomistic model increases its applicability. ⺠The image analysis is a source of valuable data in thin film physics. ⺠The best suited methods are the Voronoi tessellation and the Quadrat Counts.
Keywords
Related Topics
Physical Sciences and Engineering
Materials Science
Surfaces, Coatings and Films
Authors
Rudolf Hrach, DuÅ¡an Novotný, VojtÄch Hrubý,