Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1690972 | Vacuum | 2009 | 5 Pages |
Abstract
A powerful set of complementary techniques was used to the detailed analysis of the interfaces in order to understand and overcome the adhesion problems: RBS gave some insights on the nature of the problem by detecting composition anomalies in the substrate/coating interface; Auger spectroscopy was used for identifying the underneath chemical composition close to the interface; cross section TEM gave the final evidence of the presence of a contamination layer attributed to malfunctioning of the ion cleaning process, which was the cause of the lack of adhesion.
Keywords
Related Topics
Physical Sciences and Engineering
Materials Science
Surfaces, Coatings and Films
Authors
Carlos W. Moura e Silva, Eduardo Alves, A.R. Ramos, Cosmin S. Sandu, A. Cavaleiro,