Article ID Journal Published Year Pages File Type
1690972 Vacuum 2009 5 Pages PDF
Abstract
A powerful set of complementary techniques was used to the detailed analysis of the interfaces in order to understand and overcome the adhesion problems: RBS gave some insights on the nature of the problem by detecting composition anomalies in the substrate/coating interface; Auger spectroscopy was used for identifying the underneath chemical composition close to the interface; cross section TEM gave the final evidence of the presence of a contamination layer attributed to malfunctioning of the ion cleaning process, which was the cause of the lack of adhesion.
Related Topics
Physical Sciences and Engineering Materials Science Surfaces, Coatings and Films
Authors
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