Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1691171 | Vacuum | 2010 | 6 Pages |
Abstract
Si-rich oxide films (SiOx, 0 < x < 2) were synthesized by reactive magnetron sputtering of a single Si target in a gas mixture of argon and oxygen. Intense visible electroluminescence was observed from the as-deposited SiOx film. The microstructure of the as-sputtered SiOx films was characterized by Raman and X-ray photoelectron spectroscopy techniques. Nanoscale amorphous Si clusters formed in the as-sputtered films. The electroluminescence was attributed to the oxygen-deficient defect luminescent centres and the formation of the amorphous Si nanoclusters.
Keywords
Related Topics
Physical Sciences and Engineering
Materials Science
Surfaces, Coatings and Films
Authors
Wa Li Zhang, Sam Zhang, Ming Yang, Zhen Liu, ZhanHong Cen, Tupei Chen, Dongping Liu,