Article ID Journal Published Year Pages File Type
1691535 Vacuum 2009 4 Pages PDF
Abstract
Coarse-grained molecular dynamics computer simulations have been used to investigate the damage of a benzene crystal induced by 5 keV C60 projectile bombardment. The sputtering yield, mass distributions and the depth distributions of ejected organic molecules are analyzed. The temporal evolution of the system reveals that impinging C60 cluster leads to creation of almost hemispherical crater. Most of the molecules damaged by the projectile impact are ejected into the vacuum during cluster irradiation. This “cleaning up” effect may explain why secondary ion mass spectrometry (SIMS) analysis of some organic samples with cluster projectiles can produce significantly less accumulated damage compared to analysis performed with atomic ion beams.
Related Topics
Physical Sciences and Engineering Materials Science Surfaces, Coatings and Films
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