| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1691636 | Vacuum | 2008 | 4 Pages |
Abstract
Using ceramic targets prepared by conventional way, based on the composition Pb0.995(Zr0.65Ti0.35)0.99Nb0.01O3 + 4% mole PbO excess (PZTN), several ferroelectric films were deposited by pulsed laser ablation (PLA) technique on Pt (111) coated Si and MgO (100) substrates, using XeCl (308 nm) excimer laser. X-ray diffraction is used to characterize the produced perovskite phase (rhombohedral phase) as well as to evaluate the secondary phases and to describe the structural changes during annealing. The optical characteristics are measured in the UV–vis–near IR region. Also, ferroelectric hysteresis behaviour has been characterized by CV measurements.
Related Topics
Physical Sciences and Engineering
Materials Science
Surfaces, Coatings and Films
Authors
M. Pereira, I. Boerasu, M.J.M. Gomes,