| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1691663 | Vacuum | 2008 | 4 Pages |
Abstract
Lanthanum modified lead zirconate titanate (PLZT) thin films were fabricated on sapphire (0001) substrate by sol–gel method. The cell parameters of films were calculated with help of whole-pattern fitting procedure. The evolution of strain, shift of absorption edge and change in the band tailing with film thickness were found and analyzed for amorphous and polycrystalline PLZT films. The refractive index n was computed with help of “Envelope method” and dielectric function was calculated by fitting the measured optical transmission spectrum.
Related Topics
Physical Sciences and Engineering
Materials Science
Surfaces, Coatings and Films
Authors
A. Khodorov, M.J.M. Gomes,