| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1691836 | Vacuum | 2007 | 4 Pages |
Abstract
Experimental ellipsometric studies of Hf1−xTixO2 thin films were carried out to determine refractive indices as well as spectrometric studies of these films were carried out to determine interferential transmission spectra. The dispersion curves of the refractive indices are well described by the optical-refractometric relation. Compositional dependences of optical pseudogap and refractive indices of Hf1−xTixO2 thin films are investigated. Effect of compositional disordering on the optical absorption edge in Hf1−xTixO2 thin films is studied.
Related Topics
Physical Sciences and Engineering
Materials Science
Surfaces, Coatings and Films
Authors
I.P. Studenyak, O.T. Nahusko, M. Kranjčec,