| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1696560 | Applied Clay Science | 2007 | 6 Pages |
Abstract
A sample preparation method for FESEM microstructural analysis of sheet silicates using oriented aggregates on metallic strips parallel to the electronic beam is described. The method allows the easy measurement of thickness of kaolinite crystallites. The results have been compared to the apparent crystallite size measured by XRD The performed measurements for a set of selected kaolinites are in the range 15-60Â nm and show a good correlation with XRD crystallite thickness (in the range 11-48Â nm) obtained by the Voigt function method.
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Authors
J.V. Clausell, J. Bastida, F.J. Serrano, P. Pardo, F.J. Huertas,