Electromagnetic Monitoring of Semiconductor Ageing

This paper reports on the outcomes of the project “Electromagnetic Monitoring of Semiconductor Ageing” funded through the EPSRC Centre for Innovative Manufacturing in Through-life Engineering Services. The basis of the feasibility study reported in this paper is that all active devices exhibit non-linear behaviour and the behaviour of those devices will change as they age. As a result, the radiation or re-radiation of intermodulation products will change as the device ages. The goal of the project is to verify that this change in non-linear behaviour could be identified in a way that does not require modification of existing circuitry, thus allowing through-life and non-destructive monitoring of devices for signs of early deterioration. Results obtained from this work have been very encouraging and have set the scene for further development of the techniques to include degradation fingerprinting and system health monitoring.