| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 171550 | Comptes Rendus Chimie | 2009 | 4 Pages |
Abstract
SnxSy thin films have been grown on glass or on SnO2/glass substrates by Chemical Bath Deposition in acid solution. The crystallography, the morphology, and the chemical properties of the layers have been characterized using X-ray Diffraction, Atomic Force Microscopy, Energy Dispersive X-ray Spectroscopy, and Auger Electron Spectroscopy. The value of the [Sn]/[Thioacetamide] concentration ratio is optimized in order to obtain good quality layers satisfying stoichiometry.
Related Topics
Physical Sciences and Engineering
Chemical Engineering
Chemical Engineering (General)
Authors
M. Mnari, N. Kamoun, J. Bonnet, M. Dachraoui,