Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1759691 | Ultrasonics | 2010 | 4 Pages |
Abstract
Surface acoustic waves guided by a copper line embedded in a silica film on a silicon wafer were generated and detected optically using the laser-induced transient grating technique. Lines as narrow as â¼0.2 μm yield a good signal despite the much larger size of the laser spot. The phase velocity of the guided mode is slightly lower than the surface acoustic wave velocity in the thin film structure. Good correlation between the acoustic frequency and the electrical resistivity of the copper lines results from the dependence of both measurements on the line width.
Related Topics
Physical Sciences and Engineering
Physics and Astronomy
Acoustics and Ultrasonics
Authors
A.A. Maznev, M. Gostein,