Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1759965 | Ultrasonics | 2006 | 5 Pages |
Abstract
At ambient temperature, Al–1%Si wire of 25 μm diameter was bonded successfully onto the Au/Ni/Cu pad by ultrasonic wedge bonding technology. Physical process of the bond formation and the interface joining essence were investigated. It is found that the wire was softened by ultrasonic vibration, at the same time, pressure was loaded on the wire and plastic flow was generated in the bonding wire, which promoted the diffusion for Ni into Al. Ultrasonic vibration enhanced the interdiffusion that resulted from the inner defects such as dislocations, vacancies, voids and so on, which ascribed to short circuit diffusion.
Related Topics
Physical Sciences and Engineering
Physics and Astronomy
Acoustics and Ultrasonics
Authors
Mingyu Li, Hongjun Ji, Chunqing Wang, Han Sur Bang, Hee Seon Bang,