Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1763223 | Advances in Space Research | 2016 | 8 Pages |
Abstract
The paper presents a new physical model describing the processes in materials and electronic devices under the influence of cosmic rays in microgravity. The model identifies specific features of formation of the area of radiation defects (ARD) in the electronic materials in microgravity. The mechanism of interaction between the ARD and memory modules in microgravity causing malfunction and failure of onboard electronics is considered. The results of failure of memory modules under real conditions are presented.
Keywords
Related Topics
Physical Sciences and Engineering
Earth and Planetary Sciences
Space and Planetary Science
Authors
T. Musabayev, Zh. Zhantayev, V. Grichshenko,