Stochastic processes for line shapes and intensities

Stochastic processes provide flexible and fast calculations for modeling dynamical interactions between an atom and charged particles. We use a stochastic renewal process for the plasma microfield being the cause of Stark broadening. The accuracy and improvement possibilities of Lyman profiles calculations with a renewal process are analyzed by comparing to ab initio simulations for ion broadening only. Stochastic processes may also be applied to out of equilibrium plasmas. We present our first results for the effect of Langmuir waves on a line broadened by electrons only, and for the changes of atomic populations submitted to strong temperature fluctuations.