| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1766724 | Advances in Space Research | 2008 | 8 Pages |
Abstract
Quantifying surface roughness may contribute significantly in the stratigraphic study of the Moon. We demonstrate the root mean square (RMS) deviation method as an indicator of topographic roughness on a kilometer scale, using stereo images from an Apollo Mapping Camera in a Digital Terrain Model, and compare three regions in the lunar highlands.
Keywords
Related Topics
Physical Sciences and Engineering
Earth and Planetary Sciences
Space and Planetary Science
Authors
Y. Yokota, J. Haruyama, C. Honda, T. Morota, M. Ohtake, H. Kawasaki, S. Hara, K. Hioki,