Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1772489 | High Energy Density Physics | 2013 | 7 Pages |
Abstract
The requirement for sources of hard X-rays suitable for high resolution radiography through large ÏR targets is prominent in many aspects of current laser-driven plasma physics research. In recent work using the OMEGA EP laser facility [L. J. Waxer, M. J. Guardalben, J. H. Kelly et al., CLEO/QELS, Optical Society of America, San Jose, CA, IEEE (2008)] at the Laboratory for Laser Energetics (LLE) in Rochester, NY, experiments have been performed to measure characteristics of 22-52 keV X-ray sources using high intensity short-pulse lasers. High quality point projection, two-dimensional radiography was demonstrated by irradiating microwire targets with laser intensities of 1016 W cmâ2-1019 W cmâ2. Microwire targets were manufactured to dimensions of 10 μm Ã 10 μm Ã 300 μm and were supported by a 100 μm Ã 300 μm Ã 6 μm low-Z substrate. Measurements of the k-α conversion efficiency and X-ray source-size are discussed and, of particular importance for radiography, the spectral purity of the backlighter is characterized to assess the relative importance of the Kα emission to bremsstrahlung background.
Keywords
Related Topics
Physical Sciences and Engineering
Physics and Astronomy
Astronomy and Astrophysics
Authors
K. Vaughan, A.S. Moore, V. Smalyuk, K. Wallace, D. Gate, S.G. Glendinning, S. McAlpin, H.S. Park, C. Sorce, R.M. Stevenson,