Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1783892 | Infrared Physics & Technology | 2016 | 7 Pages |
Abstract
Thin films of manganese (III) chloride 5,10,15,20-tetraphenyl-21H,23H-porphine (MnTPPCl) with different film thickness were deposited by an evaporation technique. Some optical constants were calculated for these films at a thickness of 110, 220 and 330Â nm and annealing temperature of 373 and 437Â K. IR spectrum demonstrating that the thermal evaporation method is a good one to acquire undissociated and stoichiometric MnTPPCl films. Our perceptions demonstrate that the mechanism of the optical absorption obeys with the indirect transition. It was found that the energy gap, Eg, affected by the film thickness and annealing. Dispersion of the refractive index is described using single oscillator model. Dispersion parameters are calculated as a function of the film thickness and annealing temperature. In addition, the third-order nonlinear susceptibility, Ï(3), and the nonlinear refractive index, n2, were calculated.
Keywords
Related Topics
Physical Sciences and Engineering
Physics and Astronomy
Atomic and Molecular Physics, and Optics
Authors
S.R. Alharbi, A.A.A. Darwish, S.E. Al Garni, H.I. ElSaeedy, K.F. Abd El-Rahman,