| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1784456 | Infrared Physics & Technology | 2014 | 4 Pages |
•The measurement of the thermal diffusivity of IR semi-transparent crystals was performed by means of the PTR.•The thermal diffusivities were estimated using the simple well-known formula for thermally thick samples.•The three layer model of the PTR signal was developed.•The influence of thin, blocking IR radiation, layers on the PTR phase was discussed.
In this paper we present results of noncontact measurements of the thermal diffusivity of infrared semi-transparent n-CdMgSe mixed semiconductor crystals by means of the photothermal radiometry (PTR) in a transmission configuration. In order to overcome an influence of the infrared semi-transparency and plasma waves on the PTR signal from n-CdMgSe mixed crystals the samples were covered by thin aluminum foils on both sides. The thermal diffusivities of n-CdMgSe mixed crystals were estimated from PTR phase frequency characteristics using a well-known formula. It was found that the obtained results are underestimated in comparison to thermal diffusivities estimated from the PPE (photopyro-electric) measurements. A three layer model of a PTR signal was applied in order to estimate an error in determination of the thermal diffusivity of a sample caused by aluminum foils.
