Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1784493 | Infrared Physics & Technology | 2012 | 9 Pages |
We present an optical setup for variable angle mid infra red spectroscopic ellipsometry. The arrangement can be placed into the sample compartment of a Bruker ifs66v/s vacuum Fourier transform infrared spectrometer. A first prototype of the setup has been tested in the spectral range from 650 cm−1 to 4000 cm−1 and can measure incidence angles between 8° and 87°. We compare the measured data to reference measurements with a commercial variable angle infrared spectroscopic ellipsometer. The comparison gives a proof of concept for the discussed optical arrangement.
► An optical arrangement for variable angle reflection measurements is described. ► The setup is implemented as a spectroscopic IR ellipsometer in a bruker vacuum spectrometer. ► First proof of concept measurements are given.