Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1784514 | Infrared Physics & Technology | 2012 | 7 Pages |
Abstract
⺠We introduce an improved interframe registration based nonuniformity correction algorithm. ⺠A new masked phase correlation algorithm is presented to obtain reliable shift estimates. ⺠A decision rule is introduced to exclude the abnormal data in the error image. ⺠The variable step size strategy is presented to improve the correction precision. ⺠Our method provides the key advantages of fast convergence and minor residual error.
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Authors
Chao Zuo, Qian Chen, Guohua Gu, Xiubao Sui, Jianle Ren,