Article ID Journal Published Year Pages File Type
1784514 Infrared Physics & Technology 2012 7 Pages PDF
Abstract
► We introduce an improved interframe registration based nonuniformity correction algorithm. ► A new masked phase correlation algorithm is presented to obtain reliable shift estimates. ► A decision rule is introduced to exclude the abnormal data in the error image. ► The variable step size strategy is presented to improve the correction precision. ► Our method provides the key advantages of fast convergence and minor residual error.
Related Topics
Physical Sciences and Engineering Physics and Astronomy Atomic and Molecular Physics, and Optics
Authors
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