| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1784667 | Infrared Physics & Technology | 2009 | 4 Pages |
Abstract
Cerium fluoride (CeF3) thin films were evaporated to the germanium substrates at different substrate temperature from 100 °C to 250 °C. Structural and optical properties were characterized by X-ray diffraction (XRD), scan electron microscopy (SEM) and Fourier transform infrared spectroscopy (FTIR). The morphology of samples deposited at different temperature can be closely related to preferred orientation. The infrared optical constants were obtained by fitting the transmission spectrum using Lorentz oscillator model. A simple example for fabrication of long-wave infrared broadband antireflection coating was also presented.
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Authors
Wei-tao Su, Bin Li, Ding-quan Liu, Feng-shan Zhang,