| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1784735 | Infrared Physics & Technology | 2011 | 6 Pages |
Abstract
We present the InAs/GaSb type-II superlattice dual-color technology developed at Fraunhofer IAF. This includes insights into some of the test methodologies employed at various stages during the fabrication process, which ensure that the basic requirements for achieving high detector performance are met. Much effort is put in improving and monitoring the quality of the substrate and the epilayers. We also present performance data from a dual-color mid-wavelength infrared (MWIR) camera which incorporates the latest backside process technology.
Related Topics
Physical Sciences and Engineering
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Atomic and Molecular Physics, and Optics
Authors
Frank Rutz, Robert Rehm, Martin Walther, Johannes Schmitz, Lutz Kirste, Andreas Wörl, Jan-Michael Masur, Ralf Scheibner, Johann Ziegler,