Article ID Journal Published Year Pages File Type
1784879 Infrared Physics & Technology 2010 5 Pages PDF
Abstract

This work presents a new method for indirect identification of sectors with high current density concentration in planar microwaves devices. The method consists in the use of infrared thermography (IRT) to determine the superficial two-dimensional temperature field of the device. The results agree well with those obtained with the method that makes use of electromagnetic (EM) simulation using commercial software of numerical analysis.

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Related Topics
Physical Sciences and Engineering Physics and Astronomy Atomic and Molecular Physics, and Optics
Preview
Infrared thermography applied for high-level current density identification over planar microwave circuit sectors
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