Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1784946 | Infrared Physics & Technology | 2010 | 5 Pages |
Abstract
Polarization-modulated infrared reflection difference microspectroscopy is a sensitive tool to spatially and spectrally resolve optical anisotropy of micrometric crystalline domains. However, intrinsic artifacts are associated with polarization modulation experiments, in particular due to the wavenumber-dependent efficiency of the photoelastic modulator. Here an account addressing this problem in our experimental approach is given. Comparing data from measurements on Ca1.4Sr0.6RuO4 and Bi0.3Ca0.7MnO3+δ with model calculations, it is shown that a simple model, which is based on reports in the literature, can be used to describe the experimental results.
Related Topics
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Atomic and Molecular Physics, and Optics
Authors
M. Schmidt, J.S. Lee, U. Schade,