Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1785130 | Infrared Physics & Technology | 2009 | 4 Pages |
Abstract
In this paper the optical parameters at infrared frequencies of metallic thin films were obtained experimentally using a variable angle spectroscopic ellipsometer and used to simulate numerically the frequency response of antennas and antenna-coupled detectors at infrared frequencies (5–15 μm). The simulation results agree with previously published data and practical guidelines are presented for the design and fabrication of dipole and bowtie antennas at infrared frequencies.
Related Topics
Physical Sciences and Engineering
Physics and Astronomy
Atomic and Molecular Physics, and Optics
Authors
Francisco Javier González, Javier Alda, Jorge Simón, James Ginn, Glenn Boreman,