Article ID Journal Published Year Pages File Type
1785130 Infrared Physics & Technology 2009 4 Pages PDF
Abstract

In this paper the optical parameters at infrared frequencies of metallic thin films were obtained experimentally using a variable angle spectroscopic ellipsometer and used to simulate numerically the frequency response of antennas and antenna-coupled detectors at infrared frequencies (5–15 μm). The simulation results agree with previously published data and practical guidelines are presented for the design and fabrication of dipole and bowtie antennas at infrared frequencies.

Related Topics
Physical Sciences and Engineering Physics and Astronomy Atomic and Molecular Physics, and Optics
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