| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1785143 | Infrared Physics & Technology | 2008 | 8 Pages |
Abstract
Non-contact optical methods can be used for micrometric surface thermal characterization of active semiconductor devices. In this work, an experimental device based on near infra-red radiometric method is presented. This device is breadboard to analyze a thermal behaviour of electronic component in steadied and transient state. The absolute temperature distribution is measured at the micron scale. The obtained results highlight the excellent spatial and temporal resolution of the experimental measurement apparatus and its great sensitivity for detection of weak thermal emission variations.
Related Topics
Physical Sciences and Engineering
Physics and Astronomy
Atomic and Molecular Physics, and Optics
Authors
Sonia Dhokkar, Patrick Lagonotte, Catherine Fuentes, André Piteau,