Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1789528 | Journal of Crystal Growth | 2016 | 5 Pages |
Abstract
The catalyst-free metal organic vapor phase epitaxial growth of InAs nanowires on silicon (001) substrates is investigated by using selectively grown InP/GaAs buffer layers in V-grooved trenches. A strain-driven mechanism of self-aligned ã112ã direction InAs nanowires growing is proposed and demonstrated by the transmission electron microscopy measurement. The morphology of InAs nanowires is tapered in diameter and exhibits a hexagonal cross-section. The defect-free InAs nanowire shows a pure zinc blende crystal structure and an epitaxial relationship with InP buffer layer.
Keywords
Related Topics
Physical Sciences and Engineering
Physics and Astronomy
Condensed Matter Physics
Authors
Shiyan Li, Xuliang Zhou, Xiangting Kong, Mengke Li, Junping Mi, Mengqi Wang, Jiaoqing Pan,