| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1789729 | Journal of Crystal Growth | 2016 | 6 Pages |
Abstract
We grew Cd1âxMnx Te crystals with a nominal Mn concentration of 5% by the vertical Bridgman growth technique. The structural quality of the crystal was evaluated by white beam X-ray topography in the National Synchrotron Light Source (NSLS) facility at Brookhaven National Laboratory (BNL). We observed that the crystal was free from a sub-grain boundary network, as revealed by X-ray topography and verified by our etching study. The concentration of the secondary phases, averaged over the entire ingot, was 2-3 times lower than in conventional Bridgman grown cadmium zinc telluride (CZT) crystals.
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Authors
U.N. Roy, G.S. Camarda, Y. Cui, G. Gu, R. Gul, A. Hossain, G. Yang, S.U. Egarievwe, R.B. James,