| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1789740 | Journal of Crystal Growth | 2015 | 5 Pages |
Abstract
Polycrystalline CdZnTe thick films with an average grain size of 30 μm and thickness of 270 μm were successfully grown on SnO2:F (FTO)-coated glass substrates by close-spaced sublimation method. Electrical properties and UV response of CdZnTe thick films after Br-MeOH etching and ZnCl2 annealing treatment were investigated. By means of the photo-current measurements, the value of mobility-lifetime (μÏ) products for CdZnTe films were firstly reported. The results showed that Br-MeOH etching significantly improved UV detection sensitivity of CdZnTe thick films, and made the surface distribution of UV sensitivity more homogeneous. It was also found that a ZnCl2 annealing process did not improve the electrical properties.
Keywords
Related Topics
Physical Sciences and Engineering
Physics and Astronomy
Condensed Matter Physics
Authors
Yuelu Zhang, Linjun Wang, Run Xu, Jian Huang, Hua Meng, Jun Tao, Jijun Zhang, Jiahua Min, Yue Shen,