Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1789741 | Journal of Crystal Growth | 2015 | 26 Pages |
Abstract
Surface morphologies on the (0001¯) C facet of 4H-SiC boules grown using the physical vapor transport method were examined in various scales (from millimeter to nanometer) using different types of microscopies such as differential interference contrast (DIC) optical microscopy and atomic force microscopy (AFM). DIC optical microscopic observation revealed that there are three distinct morphological regions at the growth front of the 4H-SiC boules: the facetted region, non-facetted region and intermediate region between them. The local inclination of the facet surface from the {0001} basal plane increases toward the edge of the facetted region and then decreases in the intermediate region. AFM observations revealed that characteristic step structures were established in these two regions and that nitrogen doping significantly influenced the stability of the step structures. Based on the results, the formation mechanism of surface morphologies on the (0001¯) C facet of 4H-SiC boules is discussed.
Keywords
Related Topics
Physical Sciences and Engineering
Physics and Astronomy
Condensed Matter Physics
Authors
Tomoki Yamaguchi, Kohei Ohtomo, Shunsuke Sato, Noboru Ohtani, Masakazu Katsuno, Tatsuo Fujimoto, Shinya Sato, Hiroshi Tsuge, Takayuki Yano,