| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1790705 | Journal of Crystal Growth | 2013 | 8 Pages |
Abstract
These results demonstrate the opportunities of EDXRD for the real-time analysis of the growth process of thin films which can provide information not obtainable by any ex situ characterization method.
Related Topics
Physical Sciences and Engineering
Physics and Astronomy
Condensed Matter Physics
Authors
Jonas Schulte, Stephan Brunken, Klaus Ellmer,