Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1791060 | Journal of Crystal Growth | 2013 | 4 Pages |
Abstract
⺠AlGaN/GaN DBR structures were grown by MOVPE for RC-LED applications. ⺠Crack-free DBR stack centered at 384 nm with a 90% reflectivity was demonstrated. ⺠Smooth surfaces with atomic steps and terraces with low surface roughness were obtained. ⺠Coherently strained DBR structure was obtained with a good structural quality. ⺠TEM analysis revealed a homogeneous GaN and AlGaN layers with flat and abrupt interfaces.
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Authors
T. Moudakir, S. Gautier, S. Suresh, M. Abid, Y. El Gmili, G. Patriarche, K. Pantzas, D. Troadec, J. Jacquet, F. Genty, P. Voss, A. Ougazzaden,