Article ID Journal Published Year Pages File Type
1791068 Journal of Crystal Growth 2013 6 Pages PDF
Abstract
► High resolution synchrotron X-ray studies of phase separation phenomena. ► Scaling law h−n variation of screw & edge type dislocation densities with the overgrowth thickness. ► RSM of higher orders SXRD and ASXRD reflections reveals the presence of several diffraction peaks. ► Synchrotron X-ray study reveals the occurrence of local differences in lattice constants of AlGaN.
Keywords
Related Topics
Physical Sciences and Engineering Physics and Astronomy Condensed Matter Physics
Preview
High resolution synchrotron X-ray studies of phase separation phenomena and the scaling law for the threading dislocation densities reduction in high quality AlGaN heterostructure
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