Estimation of solidification interface shapes in a boron-phosphorus compensated multicrystalline silicon ingot via photoluminescence imaging

► A technique for estimating solidification front shapes using photoluminescence imaging on as-cut wafers is presented. ► Dopant density images are obtained from wafers under surface limited conditions. ► A frequency filtering technique is applied to remove the effect of grain boundaries. ► This technique is applicable to ingots grown by directional solidification.