| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1791190 | Journal of Crystal Growth | 2013 | 5 Pages |
Electron backscatter diffraction (EBSD) and Raman scattering were used to characterize twins and Te particles in CdMnTe crystals grown by the vertical Bridgman method. The size, concentration and phase structure of Te particles, as well as the orientation of twins were studied. {111} twins decorated with Te particles were identified by low and high magnitude EBSD mapping. Three type crystal phases of Te particles were observed, including hexagonal, monoclinic and high-pressure rhombohedral phase. Most of Te particles were preferentially oriented with the {110}CdMnTe//{112¯0}Te. The A1 (Te) and E (Te) modes in CdMnTe Raman scattering spectroscopy were found with red-shift than single Te phase due to the tensile stress effect.
► Twins in CdMnTe crystals lying on {111} plane was observed by EBSD mapping. ► Te inclusions and Te precipitations were observed to decorate twin boundaries. ► Hexagonal, monoclinic and rhombohedral phase Te precipitates were identified. ► The relationship between hexagonal precipitates and matrix was {110}CMT//{112¯0}Te. ► Rhombohedral phase Te precipitates caused tensile stress on CdMnTe crystal.
