| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1791468 | Journal of Crystal Growth | 2012 | 5 Pages |
Perfection of NaNO3 single crystals grown by axial vibrational control technique in the Czochralski configuration (AVC-CZ) by submerging an oscillating baffle into the melt under the crystal was studied. The characteristics of AVC-CZ grown crystals were analyzed by micro-Raman technique, X-ray structural analysis and chemical dislocation etching. For the AVC-CZ grown NaNO3 single crystals the structure sensitive properties of high-quality were demonstrated.
► AVC-CZ technique efficiency depends on a ratio of an edge radius to cylindrical generatrix of disk. ► AVC-CZ crystal grown at 12mm/h pulling rate had FWHM of X-ray rocking curves 4 times less than that for seed crystal. ► Microhardness of AVC-CZ NaNO3 crystal was 2 times higher comparing to the conventional CZ crystal.
