| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1791520 | Journal of Crystal Growth | 2012 | 5 Pages |
Abstract
Nanometric double layer properties of different metal-semiconductor-metal (MSM) depositions onto CdZnTe produced by electroless method are investigated. The mechanisms of the deposition are discussed and the theoretical chemical equations implied in the process are presented. The solutions for different time of deposition and the deposited layers are analysed by TXRF to test the proposed reactions. RBS was used to determine the thickness, the depth profiles and the composition of the layers deposited at the surface. This work showed the feasibility of depositing nanometric double layers using electroless technique.
Keywords
Related Topics
Physical Sciences and Engineering
Physics and Astronomy
Condensed Matter Physics
Authors
Q. Zheng, F. Dierre, V. Corregidor, R. Fernández-Ruiz, J. Crocco, H. Bensalah, E. Alves, E. Diéguez,