| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1791770 | Journal of Crystal Growth | 2012 | 4 Pages |
Abstract
Ce:LiSrAlF6 and Eu:LiSrAlF6 crystals with different dopant concentrations were grown by the micro-pulling-down method. The crystals with high dopant crystal included the secondary phase as clusters with the plate shape in BSE images. The secondary phases were identified CeF3 and EuF2, respectively, by the EDS analysis and powder-XRD measurement. Eu concentration against the Sr sites in the Eu 2% doped LiSAF crystal were most uniform in the range 0.9–1.6 atm% using the EPMA.
► Ce:LiSrAlF6 and Eu:LiSrAlF6 crystals were grown by the micro-pulling down method. ► The secondary phases were identified by EDS and powder-XRD. ► Eu concentration in the crystal was evaluated using the EPMA measurement.
Related Topics
Physical Sciences and Engineering
Physics and Astronomy
Condensed Matter Physics
Authors
A. Yamaji, Y. Yokota, T. Yanagida, N. Kawaguchi, Y. Futami, Y. Fujimoto, A. Yoshikawa,