| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1791973 | Journal of Crystal Growth | 2012 | 6 Pages |
Abstract
⺠CdZnTe single crystals were grown from the vapour phase and sliced into wafers. ⺠Extended defects within these wafers were analysed using synchrotron X-ray topography. ⺠Various defects were identified: grain-boundaries, voids, cracks and sub-grains. ⺠Surface damage from wire saw slicing was also observed. ⺠Wafer peripheries showed numerous defects; central regions were of better quality.
Keywords
Related Topics
Physical Sciences and Engineering
Physics and Astronomy
Condensed Matter Physics
Authors
Christopher K. Egan, Ashutosh Choubey, Moreton Moore, Robert J. Cernik,